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Diodes 產品變更說明


每個 PCN 皆提供聯絡人與實施日期、提醒類別與類型、PCN 號碼、標題、影響、變更說明,以及 Diodes 所製造且受到產品/製程變更之影響的完整元件清單。若要檢視 PCN,請按一下 PCN# PDF。

若要自動接收 PCN 通知/電子郵件提醒

PCN # Issue Date Implementation Date Product Family Change Type
PCN-2322 (Advance Notice) 2018-03-19 2020-03-15 Analog Automotive Fab Porting from Global Foundries to MagnaChip
PCN-2321 2018-02-22 2018-08-22 Analog Device End of Life (EOL)
PCN-2319 2018-03-09 2018-06-09 Discrete Automotive Qualification of Alternative Wafer Sources for Select Automotive Products Due to Closure of Diodes FabTech (KFAB) Facility
PCN-2318 2018-01-22 2018-01-22 Discrete Device End of Life (EOL)
PCN-2315 2018-03-09 2018-06-09 Discrete Qualification of Alternative Wafer Sources for Select Products Due to Closure of Diodes FabTech (KFAB) Facility
PCN-2313 2019-10-21 2020-01-21 Discrete Semiconductors Qualification of "Diodes Technology (Cheng Du) Company Limited" (CAT) as an Additional Assembly & Test Site, Conversion
to Copper Bond Wire, and Qualification of Additional Die Passivation Layer on Select Products
PCN-2312 2018-04-11 2018-07-11 Analog Qualification of Additional Bill of Materials (BOM), Top Marking, and Fab Source for Select Products
PCN-2311 2018-05-22 2018-11-22 Analog - Automotive Device End of Life (EOL)
PCN-2310 2018-01-24 2018-01-24 Analog Device End of Life (EOL)
PCN-2305 2018-02-28 2018-05-28 Discrete Addition of A Passivation Layer Over The Top Metal of The Die for Selected BJT Devices
PCN-2304 2018-01-05 2018-04-05 Analog Additional Qualified Fab Source for MOSFET Devices and BOM (Bill of Materials) on Selected Devices
PCN-2300 2018-03-07 2018-06-07 Discrete Qualification of Additional Assembly and Test Sites
PCN-2299 2018-03-01 2018-06-01 Analog Semiconductors Additional Qualified (A/T) Assembly Test Site
PCN-2293 2018-01-16 2018-01-16 Analog Fab Transfer for PT7C4512WE and PT7C4512WEX Devices Due to Current Fab Closure
PCN-2292 2018-01-17 2018-04-17 Analog Die Revision Upgrade