Diodes Incorporated (Diodes) has conducted extensive studies to analyze and test the quality, reliability, and usability of Diodes semiconductor finished good (FG) components that were subject to long-term storage (LTS) under controlled environmental conditions.
We generated and collected sufficient supporting data based on components manufactured across multiple package types and assembly & test facilities to ensure product quality and reliability may not be negatively impacted by long-term storage of up to shelf life of at least 3 years from the date of manufacture.
Diodes is committed to continue performing further age-related reliability testing and analysis in the future to pursue ensuring an even longer shelf life for our FG products. Results of these exercises will be published accordingly as they become available.
