Diodes Incorporated
PowerDI3333 8

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DMTH43M8LFG

40V +175°C N-CHANNEL ENHANCEMENT MODE MOSFET

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Description

This MOSFET is designed to minimize the on-state resistance (RDS(ON)) yet maintain superior switching performance, making it ideal for high-efficiency power management applications.

Feature(s)

  • Rated to +175°C — Ideal for High Ambient Temperature Environments
  • 100% Unclamped Inductive Switching, Test in Production — Ensures More Reliable and Robust End Application
  • Low RDS(ON) — Ensures On-State Losses are Minimized
  • Excellent QGD × RDS(ON) Product (FOM)

Application(s)

  • DC-DC Converters
  • Power Management

Product Specifications

Product Parameters

AEC Qualified Yes
Compliance (Only Automotive(Q) supports PPAP) Standard
Polarity N
ESD Diodes (Y|N) No
|VDS| (V) 40 V
|VGS| (±V) 20 ±V
|IDS| @TA = +25°C (A) 24 A
|IDS| @TC = +25°C (A) 100 A
PD @TA = +25°C (W) 2.62 W
PD @TC = +25°C (W) 65.2 W
RDS(ON)Max@ VGS(10V)(mΩ) 3 mΩ
RDS(ON)Max@ VGS(4.5V)(mΩ) 5 (@5V) mΩ
|VGS(TH)| Max (V) 2.5 V
QG Typ @ |VGS| = 10V (nC) 40.1 nC
CISS Typ (pF) 2798 pF
CISS Condition @|VDS| (V) 20 V

Technical Documents

SPICE Model

Recommended Soldering Techniques

TN1.pdf

RoHS CofC

Product Change Notices (PCNs)

A PCN may only apply to specific orderable part numbers in this datasheet. Please refer to the corresponding PCN to see the exact orderable part number(s) affected.

PCN # Issue Date Implementation Date Subject
PCN-2628 2023-05-11 2023-08-11 Qualification of Additional Wafer Solderable Front Metal Plating, Back Grinding and Back Metal Process Source for Select Discrete Products
PCN-2495 2021-03-31 2021-07-01 Qualification of Additional Assembly & Test Sites and Additional Wafer Back Grinding and Back Metal Process
Source for Select Discrete Products

FAQs

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