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BAV70W

Dual Surface-Mount Switching Diode

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Feature(s)

  • Fast Switching Speed: Maximum of 4ns
  • Low Capacitance: Maximum of 2.0pF
  • Small Surface-Mount Package
  • For General-Purpose Switching Applications
  • Lead-Free Finish; RoHS Compliant (Notes 1 & 2)
  • Halogen and Antimony Free. “Green” Device (Note 3)
  • The BAV70WQ is suitable for automotive applications requiring specific change control; this part is AEC-Q101 qualified, PPAP capable, and manufactured in IATF 16949 certified facilities. https://www.diodes.com/quality/product-definitions/

Specifications & Technical Documents

Product Parameters

Compliance (Only Automotive Supports PPAP)

Standard

AEC Qualified

Yes

Configuration

Dual, Com. Cath

Polarity

Anode, Cathode

Power Rating(mW)

200 mW

ESD Diodes (Y|N)

No

Peak RepetitiveReverse VoltageVRRM (V)

75 V

Reverse RecoveryTime trr (ns)

4 ns

Trr(ns) Max @ IF=IR=10 mA, Irr=0.1xIR, RL=100Ω

4

V(BR)R (V) Min @IR=100μA

75

Maximum Average Rectifier Current IO (mA)

150 mA

Maximum Peak Forward Surge Current IFSM (A)

2 A

Forward Voltage Drop VF @ IF (mA)

1 mA

Maximum ReverseCurrent IR (µA)

2.5 µA

TotalCapacitance CT (pF)

2 pF

Maximum Reverse Current IR @ VR (V)

75 V

VF(V) Max @ IF=1.0mA

0.715

VF(V) Max @ IF=10mA

0.855

IR(uA) Max @ VR=80V

2.5uA@75V

CT(pF) Max @ VR = 0V, f = 1MHz

2

Related Content

Packages

Technical Documents

SPICE Model

Recommended Soldering Techniques

TN1.pdf

RoHS CofC

Purchase & Availability

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Product Change Notices (PCNs)

A PCN may only apply to specific orderable part numbers in this datasheet. Please refer to the corresponding PCN to see the exact orderable part number(s) affected.

PCN # Issue Date Implementation Date Subject
PCN-2770 2025-10-30 2025-10-30 Add Fab Site Code, Country of Diffusion (COD) and Assembly Site Origin (ASO) on Product and Shipping Labels for all Diodes Products
PCN-2584 2022-05-19 2022-11-19 Device End of Life (EOL)
PCN-2461 2020-05-08 2021-04-05 Phenitec Wafer Manufacturing Site Change, Additional Wafer Sources, Wafer Diameter Change, Additional Assembly and Test Site