Diodes Incorporated — Analog and discrete power solutions
Back to Small Signal Switching Diodes

BAV116WSQ

SURFACE MOUNT LOW LEAKAGE DIODE

Contact Sales

Log in or register to manage email notifications about changes to datasheets or PCNs for this part.

Description

Surface mount low leakage diode.

Feature(s)

  • Ultra Low Leakage Current (5nA @ VR = 75V)
  • Low Capacitance

Application(s)

  • Mobile Phones
  • Portable and Consumer Electronics

Product Specifications

Product Parameters

AEC Qualified Yes
Compliance (Only Automotive supports PPAP) Automotive
Configuration Anode, Cathode
Polarity Anode, Cathode
Power Rating(mW) 200 mW
ESD Diodes (Y|N) No
Peak RepetitiveReverse VoltageVRRM (V) 85 V
Reverse RecoveryTime trr (ns) 3000 ns
Maximum Average Rectifier Current IO (mA) 215 mA
Maximum Peak Forward Surge Current IFSM (A) 4 A
Forward Voltage Drop VF @ IF (mA) 0.9, 1 mA
Maximum ReverseCurrent IR (µA) 0.005 µA
TotalCapacitance CT (pF) 1.5 pF
VF(V) Max @ IF=100mA 1
V(BR)R (V) Min @IR=100μA 85
Trr(ns) Max @ IF=IR=10 mA, Irr=0.1xIR, RL=100Ω 3000
Maximum Reverse Current IR @ VR (V) 75 V
IR(uA) Max @ VR=80V 5nA@75V

Related Content

Packages

Technical Documents

Recommended Soldering Techniques

TN1.pdf

Product Change Notices (PCNs)

A PCN may only apply to specific orderable part numbers in this datasheet. Please refer to the corresponding PCN to see the exact orderable part number(s) affected.

PCN # Issue Date Implementation Date Subject
PCN-2640 2023-09-12 2024-03-13 Device End of Life (EOL) - Automotive
PCN-2545 2021-10-05 2022-01-05 Phenitec Wafer Manufacturing Site Change and Additional Wafer Source on Select Automotive Products
PCN-2462 2020-05-08 2021-04-11 Phenitec Wafer Manufacturing Site Change, Additional Wafer Sources, Wafer Diameter Change, Additional Assembly and Test Site (Automotive)
PCN-2319 2018-03-09 2018-06-09 Qualification of Alternative Wafer Sources for Select Automotive Products Due to Closure of Diodes FabTech (KFAB) Facility