Diodes Incorporated — Analog and discrete power solutions
SMC

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B370

Schottky

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Feature(s)

  • Guard Ring Die Construction for Transient Protection
  • Low Power Loss, High Efficiency
  • Surge Overload Rating to 100A Peak
  • For Use in Low-Voltage, High Frequency Inverters, Free Wheeling, and Polarity Protection Application
  • Lead-Free Finish; RoHS Compliant (Notes 1 & 2)
  • Halogen and Antimony Free. “Green” Device (Note 3)
  • For automotive applications requiring specific change control (i.e.: parts qualified to AEC-Q100/101/104/200, PPAP capable, and manufactured in IATF 16949 certified facilities), please refer to the related automotive grade (Q-suffix) part. A listing can be found at https://www.diodes.com/products/automotive/automotiveproducts/.
  • This part is qualified to JEDEC standards (as references in AEC-Q) for High Reliability. https://www.diodes.com/quality/product-definitions/
  • An automotive-compliant part is available under separate datasheet (B370Q–B3100Q).

Specifications & Technical Documents

Product Parameters

Compliance (Only Automotive Supports PPAP) Standard
AEC Qualified Yes
Configuration Single
MaximumAverageRectifiedCurrent IO (A) 3 A
@ TerminalTemperature TT (ºC) 90 ºC
Peak RepetitiveReverse VoltageVRRM (V) 70 V
Peak ForwardSurge CurrentIFSM(A) 100 A
Forward VoltageDrop VF(V) 0.79 V
@ IF (A) 3 A
Maximum ReverseCurrent IR (µA) 500 µA
@ VR (V) 70 V
TotalCapacitance CT (pF) 100 pF

Related Content

Packages

Technical Documents

SPICE Model

MDS Reports

Recommended Soldering Techniques

TN1.pdf

RoHS CofC

Purchase & Availablity

Product Change Notices (PCNs)

A PCN may only apply to specific orderable part numbers in this datasheet. Please refer to the corresponding PCN to see the exact orderable part number(s) affected.

PCN # Issue Date Implementation Date Subject
PCN-2623 2023-05-15 2023-11-15 Device End of Life (EOL)
PCN-2588 2022-06-01 2022-09-01 Qualification of Additional Clip Bonding, Lead Frame Structure (Matrix) and Mold Compound, and Qualification of Additional
Diodes Internal Assembly & Test Site (SSEC) for Select Discrete Products
PCN-2550 2021-12-20 2022-06-20 Device End of Life (EOL)
PCN-2477 2020-08-17 2021-05-09 Additional Wafer Source (GFAB), and Transfer Assembly and Test Site to DiYi